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Journal Articles

Analysis of transient current induced in silicon carbide diodes by oxygen-ion microbeams

Oshima, Takeshi; Sato, Takahiro; Oikawa, Masakazu*; Yamakawa, Takeshi; Onoda, Shinobu; Wakasa, Takeshi; Laird, J. S.; Hirao, Toshio; Kamiya, Tomihiro; Ito, Hisayoshi; et al.

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.177 - 180, 2004/10

no abstracts in English

Journal Articles

Change in the electrical characteristics of p-channel 6H-SiC MOSFETs by $$gamma$$-ray irradiation

Oshima, Takeshi; Ito, Hisayoshi

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.191 - 194, 2004/10

no abstracts in English

Journal Articles

Change of majority-carrier concentration in p-type silicon by 10 MeV proton irradiation

Iwata, Hiroshi*; Kagamihara, Satoshi*; Matsuura, Hideharu*; Kawakita, Shiro*; Oshima, Takeshi; Kamiya, Tomihiro

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.143 - 146, 2004/10

no abstracts in English

Journal Articles

Development of a high-energy heavy ion microbeam system at the JAERI AVF cyclotron

Sato, Takahiro; Oikawa, Masakazu*; Sakai, Takuro; Okumura, Susumu; Kurashima, Satoshi; Miyawaki, Nobumasa; Fukuda, Mitsuhiro; Yokota, Wataru; Kamiya, Tomihiro

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.207 - 210, 2004/10

A focused high-energy heavy ion scanning microbeam system with a spatial resolution of about 1$$mu$$m is being developed at the AVF cyclotron of JAERI-Takasaki. It will provide microbeams to applications such as radiation tolerance testing of semiconductor devices and radio microsurgery in biomedical science with single ion hit technique. The main system components (slits, a beam scanner, quadrupole magnets and so on) had been installed in 2002. Test operations have been carried out since last year. We report the results obtained so far.

Journal Articles

Bulk damage observed in recent LSI devices

Shindo, Hiroyuki*; Kuboyama, Satoshi*; Ikeda, Naomi*; Otomo, Hiromitsu*; Shimada, Osamu*; Hirao, Toshio; Matsuda, Sumio*

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.63 - 66, 2004/10

no abstracts in English

Journal Articles

Charge collected in Si MOS capacitors and SOI devices p$$^{+}$$n diodes due to heavy ion irradiation

Hirao, Toshio; Laird, J. S.; Onoda, Shinobu; Shibata, Toshihiko*; Wakasa, Takeshi; Yamakawa, Takeshi; Abe, Hiroshi; Takahashi, Yoshihiro*; Onishi, Kazunori*; Ito, Hisayoshi

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.105 - 109, 2004/10

no abstracts in English

Journal Articles

Heavy-ion induced current in MOS structure

Takahashi, Yoshihiro*; Shibata, Toshihiko*; Murase, Yuji*; Onishi, Kazunori*; Hirao, Toshio; Kamiya, Tomihiro

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.111 - 114, 2004/10

no abstracts in English

Journal Articles

Time-resolved laser and ion microbeam studies of single event transients in high-speed optoelectronic devices

Laird, J. S.; Hirao, Toshio; Onoda, Shinobu; Wakasa, Takeshi; Yamakawa, Takeshi; Abe, Hiroshi; Kamiya, Tomihiro; Ito, Hisayoshi

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.125 - 129, 2004/10

no abstracts in English

Journal Articles

Consideration to reliability of laser testing for evaluating SEU tolerance

Abe, Tetsuo*; Onishi, Kazunori*; Takahashi, Yoshihiro*; Hirao, Toshio

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.157 - 160, 2004/10

no abstracts in English

Journal Articles

Improved model for single-event burnout mechanism

Kuboyama, Satoshi*; Ikeda, Naomi*; Hirao, Toshio; Matsuda, Sumio*

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.165 - 168, 2004/10

no abstracts in English

Journal Articles

Study on proton-induced single event upset in Sub-0.1$$mu$$m CMOS LSIs

Fukui, Hironobu*; Hamaguchi, Masafumi*; Yoshimura, Hisao*; Oyamatsu, Hisato*; Matsuoka, Fumitomo*; Noguchi, Tatsuo*; Hirao, Toshio; Abe, Hiroshi; Onoda, Shinobu; Yamakawa, Takeshi; et al.

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.169 - 172, 2004/10

no abstracts in English

Journal Articles

Evaluation of transient current induced by high energy charged particles in Si PIN photodiode

Onoda, Shinobu; Hirao, Toshio; Laird, J. S.; Wakasa, Takeshi; Yamakawa, Takeshi; Okamoto, Tsuyoshi*; Koizumi, Yoshiharu*; Kamiya, Tomihiro; Ito, Hisayoshi

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.173 - 176, 2004/10

no abstracts in English

Journal Articles

The Degradation of the electrical properties of IGBTs by 2-MeV electron irradiation at high-temperatures

Nakabayashi, Masakazu*; Oyama, Hidenori*; Hanano, N.*; Hirao, Toshio; Simoen, E.*; Claeys, C.*

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.183 - 186, 2004/10

no abstracts in English

Journal Articles

Effect of damage on transient current waveform observed in GaAs schottky diode by single ion hit

Hirao, Toshio; Laird, J. S.; Onoda, Shinobu; Wakasa, Takeshi; Ito, Hisayoshi

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.187 - 189, 2004/10

no abstracts in English

Journal Articles

Comparison of COTS SRAMs and SDRAMs on total ionizing dose tolerance

Takeuchi, Koichiro*; Akiyama, Masatsugu*; Hirao, Toshio

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.195 - 199, 2004/10

no abstracts in English

Journal Articles

Measurement and analysis of single event transient current induced in Si devices by quasi-monoenergetic neutrons

Wakasa, Takeshi; Hirao, Toshio; Sanami, Toshiya*; Onoda, Shinobu; Abe, Hiroshi; Tanaka, Susumu; Kamiya, Tomihiro; Okamoto, Tsuyoshi*; Ito, Hisayoshi

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.213 - 216, 2004/10

no abstracts in English

Journal Articles

Possibility analysis of Cu(InGa)Se$$_{2}$$ thin-film solar cells for space use

Kawakita, Shiro*; Shimazaki, Kazunori*; Imaizumi, Mitsuru*; Kuwajima, Saburo*; Yoda, Shinichi*; Oshima, Takeshi; Ito, Hisayoshi

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.151 - 154, 2004/10

no abstracts in English

Journal Articles

Study of high-energy proton and electron irradiation effects on poly- and single-crystalline CuInSe$$_{2}$$ films

Okada, Hiroshi*; Natsume, Satoshi*; Wakahara, Akihiro*; Yoshida, Akira*; Oshima, Takeshi; Kamiya, Tomihiro

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.147 - 150, 2004/10

no abstracts in English

Journal Articles

Carrier removal and defect generation in lattice-mismatched InGaP under 1 MeV electron irradiation

Ekins-Daukes, N. J.*; Lee, H. S.*; Sasaki, Takuo*; Yamaguchi, Masafumi*; Khan, A.*; Takamoto, Tatsuya*; Agui, Takaaki*; Kamimura, Kunio*; Kaneiwa, Minoru*; Imaizumi, Mitsuru*; et al.

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.87 - 91, 2004/10

no abstracts in English

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